000 00820nam a2200277Ia 4500
001 58587
003 BIBL
005 20160527190637.0
008 710308s1970 ne a 00110 eng
010 _a 76108283 //r912
015 _aNe70-38
020 _a072041752X
040 _aDLC
_cDLC
_dDLC
049 _aEVLG
050 0 0 _aQH212.F5
_bB66
082 0 0 _a548/.83
100 1 0 _aBowkett, K. M.
_9203932
_2Local
245 1 0 _aField-ion microscopy.
_c[By] K. Bowkett and D. A. Smith.
260 0 _aAmsterdam
_bNorth-Holland Pub. Co.
_c1970.
300 _ax, 257 p. with illus.
_c23 cm.
350 _afl54.00
490 0 _aDefects in crystalline solids
_vv. 2
500 _a921004
650 0 _aField ion microscopy.
_9223598
_2Local
700 1 0 _aSmith, David A.
_q(David Anthony)
_d1943-
_ejoint author.
_9277975
_2Local
999 _c44755
_d44755