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Near-field optics studies the behaviour of light fields in the vicinity of matter, where light is structured in propagating and evanescent fields. Near-field optical microscopy is the straightforward application of near-field optics.This textbook provides an overview for undergraduates and anyone who has an interest in peculiar optical phenomena, and serves as a technical manual for engineers and researchers. It consists of 12 chapters dealing with the history of near-field optics, non-radiating optics, optical noise, inverse problems, theory, instrumentation and applications; there is an appendix including the basic elements of Fourier optics and Maxwell equations.

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• Preface(p. ix)
• How to read this book(p. xi)
• Chapter 1 History of Near-field Optics(p. 1)
• 1.1 Notion of imaging system(p. 1)
• 1.2 Bases of imaging(p. 4)
• 1.2.1 Vision(p. 4)
• 1.2.2 Image(p. 5)
• 1.2.3 Far-field imaging systems(p. 6)
• 1.2.4 Notion of superresolution(p. 7)
• 1.2.5 Near-field imaging systems(p. 9)
• 1.3 History of near-field microscopy(p. 12)
• 1.3.1 Synge's speculation(p. 12)
• 1.3.2 J. O'Keefe's letter(p. 12)
• 1.3.3 E. Ash and G. Nicholls realization(p. 13)
• 1.3.4 Superresolution in imaging systems(p. 13)
• 1.3.5 Scanning tunnelling microscopy(p. 14)
• 1.3.6 Early optical near-field microscopes(p. 14)
• Chapter 2 Non-radiating Sources & Non-propagating Fields(p. 17)
• 2.1 Introduction(p. 17)
• 2.1.1 A few words of terminology(p. 18)
• 2.2 Various non-radiating sources(p. 18)
• 2.3 Non-radiating classical distributions(p. 18)
• 2.4 Non-radiating sources by destructive interference(p. 21)
• 2.5 Extension of the notion of non-radiating source(p. 23)
• 2.5.1 Evanescent fields(p. 24)
• 2.5.2 Evanescent field generated by total internal reflection(p. 24)
• 2.5.3 Destructive-interference device(p. 25)
• 2.5.4 Resonant evanescent fields(p. 26)
• 2.5.5 Resonant spherical devices(p. 29)
• Chapter 3 Evanescent Optics(p. 31)
• 3.1 Theory of Fresnel evanescent waves(p. 32)
• 3.1.1 Reflection and refraction laws(p. 32)
• 3.1.2 Total internal reflection(p. 34)
• 3.1.3 Energy flow and Poynting vector(p. 37)
• 3.1.4 Goos-Hanchen and transversal shifts(p. 38)
• 3.2 Evanescent fields generated by sub-wavelength diffraction(p. 42)
• 3.3 Light beam propagation(p. 43)
• 3.4 A particular case of evanescent waves: the plasmons(p. 48)
• 3.4.1 Definition of a plasmon(p. 48)
• 3.4.2 Theory(p. 49)
• 3.4.3 Scanning plasmon optical microscopy(p. 51)
• Chapter 4 Theories and Modellings(p. 57)
• 4.1 Early works(p. 57)
• 4.2 Recent works(p. 58)
• 4.3 Different ways of approaching the theory of near-field optics(p. 59)
• 4.3.1 Physical approach(p. 59)
• 4.3.2 Model space(p. 60)
• 4.3.3 Global or non-global approach(p. 60)
• 4.4 Tip description(p. 61)
• 4.4.1 Description in a non-global scheme(p. 61)
• 4.4.2 Description in a global scheme(p. 68)
• 4.5 Light-sample interaction(p. 69)
• 4.5.1 Rigorous grating theory(p. 69)
• 4.5.2 The reciprocal-space perturbative method (RSPM)(p. 73)
• 4.5.3 Direct-space-global approaches(p. 77)
• Chapter 5 Inverse Problem and Apparatus Function(p. 93)
• 5.1 Introduction(p. 93)
• 5.2 Inverse problem solution in band-limited far-field imaging(p. 97)
• 5.3 Inverse propagator and reciprocity theorem(p. 98)
• 5.3.1 Reciprocity theorem(p. 98)
• 5.4 Inverse problem solution in near-field imaging(p. 100)
• 5.5 Apparatus functions(p. 100)
• 5.5.1 Impulse response(p. 101)
• 5.5.2 Transfer function(p. 101)
• Chapter 6 Criteria of Quality, Noise and Artifacts(p. 103)
• 6.1 Degrees of freedom of an optical system(p. 103)
• 6.1.1 Generalization of Lukosz's approach(p. 104)
• 6.1.2 Far-field case(p. 105)
• 6.1.3 Near-field case(p. 106)
• 6.1.4 Information capacity for noisy coherent signals(p. 107)
• 6.2 Noise in optical systems(p. 107)
• 6.2.1 Optical noises(p. 108)
• 6.2.2 External noises(p. 111)
• 6.3 Artifacts(p. 112)
• 6.3.1 Scanning modes in near-field microscopy(p. 112)
• 6.3.2 Notion of artifact(p. 112)
• 6.4 Comparison between the three scanning mode behaviours(p. 115)
• 6.4.1 Input parameters of the simulation(p. 115)
• 6.4.2 Constant distance mode(p. 117)
• 6.4.3 Constant height mode(p. 118)
• 6.4.4 Constant intensity mode(p. 119)
• 6.5 Notion of resolution(p. 123)
• 6.5.1 Detection(p. 123)
• 6.5.2 Localization(p. 124)
• 6.5.3 Resolution(p. 125)
• 6.5.4 The two-point criterion(p. 126)
• 6.5.5 Other estimates of resolution(p. 127)
• 6.5.6 Optical transfer function OTF(p. 130)
• 6.5.7 OTF in near-field optics(p. 131)
• 6.5.8 Experimental OTF in near-field optics(p. 132)
• 6.5.9 Contrast(p. 133)
• 6.5.10 New criteria of quality(p. 136)
• Chapter 7 Nano-collectors and Nano-emitters(p. 139)
• 7.1 Precursors(p. 139)
• 7.2 Near-field collection and emission(p. 140)
• 7.2.1 Principle(p. 140)
• 7.2.2 Distance of collection/emission(p. 141)
• 7.2.3 Shape of nano-collectors/emitters(p. 141)
• 7.3 Various technologies(p. 145)
• 7.4 Bare tapers(p. 148)
• 7.4.1 Shaping techniques(p. 148)
• 7.4.2 Etching techniques(p. 148)
• 7.4.3 Effect of parameters(p. 149)
• 7.4.4 More sophisticated procedures(p. 150)
• 7.4.5 High aperture angle conical tips(p. 151)
• 7.4.6 Hot stretching techniques(p. 151)
• 7.4.7 Advantages and drawbacks of the two techniques(p. 153)
• 7.4.8 Tapered metal wire and silicon AFM tips(p. 154)
• 7.4.9 Pyramidal tips(p. 155)
• 7.5 Coated materials(p. 157)
• 7.5.1 Flat nano-apertures(p. 158)
• 7.5.2 Tapered nano-apertures(p. 162)
• 7.5.3 Tapered/cleaved fibres(p. 164)
• 7.5.4 Efficiency of tapered metal coated fibres(p. 166)
• 7.5.5 Laser damages(p. 166)
• 7.5.6 Realization of the aperture by other techniques(p. 167)
• 7.6 Nano-antenna used as a near-field perturbing system(p. 170)
• 7.7 Variant of tapered fibres(p. 171)
• 7.8 Chemical sensors used as fluorescent tips(p. 171)
• Chapter 8 Instrumentation(p. 175)
• 8.1 Basic structure of near-field optical microscopes(p. 175)
• 8.2 Mechanical part(p. 176)
• 8.2.1 Translation stage(p. 176)
• 8.2.2 Practical case(p. 179)
• 8.2.3 Techniques for machining the piezo-electric tube(p. 179)
• 8.2.4 Compensation of the thermal drift(p. 181)
• 8.2.5 Connection of the wires on the electrodes(p. 182)
• 8.3 Holding of the nano-collector/emitter(p. 182)
• 8.3.1 Fibre as a nano-collector/emitter(p. 182)
• 8.3.2 Other collector/emitters(p. 184)
• 8.4 Anti-vibration devices(p. 184)
• 8.4.1 Distance control(p. 185)
• 8.5 Optical part(p. 192)
• 8.5.1 Source(p. 192)
• 8.5.2 Detector(p. 194)
• 8.5.3 Usual optical and opto-electronic components(p. 195)
• 8.6 Electronic stages(p. 195)
• 8.6.1 Synchronous detection(p. 196)
• 8.6.2 Distance control: the P.I.D. device(p. 196)
• Chapter 9 Main Near-field Microscope Configurations(p. 201)
• 9.1 Transmission microscopes(p. 202)
• 9.2 Reflection microscopy(p. 204)
• 9.3 Tunnelling microscopy(p. 206)
• 9.4 Optical tunnelling microscopy(p. 208)
• 9.5 Plasmon microscopy(p. 212)
• 9.6 Hybrid techniques(p. 213)
• 9.6.1 Near-field microscopy with shear-force control(p. 213)
• 9.6.2 Contact near-field optical microscopy(p. 214)
• Chapter 10 Near-field Image Processing(p. 215)
• 10.1 Generalities(p. 215)
• 10.1.1 Linear distortions(p. 215)
• 10.1.2 Non-linear distortions(p. 216)
• 10.2 Correction of distortions(p. 218)
• 10.2.1 Correction of linear distortions(p. 218)
• 10.2.2 Correction of non-linear distortions(p. 220)
• 10.2.3 Correction of tip-sample sticking(p. 220)
• 10.3 Filtering process(p. 220)
• 10.3.1 Direct or local filtering(p. 220)
• 10.3.2 Fourier or reciprocal filtering(p. 227)
• 10.4 Karhunen-Loeve transform and information extraction(p. 229)
• Chapter 11 Applications of Near-field Microscopy(p. 235)
• 11.1 Introduction(p. 235)
• 11.1.1 First attempts: topography measurements(p. 236)
• 11.1.2 Local index variation measurement(p. 236)
• 11.2 Light trapping(p. 242)
• 11.3 Concept of nano-optics(p. 243)
• 11.4 A simple case: the frustrated reflection by a sphere or a tip(p. 244)
• 11.5 A second example: the resonant tunnelling effect(p. 244)
• 11.6 A more sophisticated example: a sub-wavelength periodic structure(p. 245)
• 11.7 Photonic transfer through segmented optical waveguides(p. 246)
• Appendix A Basis of Optics(p. 249)
• A.0.1 Unit Systems(p. 249)
• A.1 Basic functions and operators in optics(p. 250)
• A.1.1 Reminder on vectorial calculus(p. 250)
• A.1.2 Relations connecting gradient, divergence and rotational(p. 252)
• A.1.3 Dyadic analysis(p. 252)
• A.2 Maxwell's equations(p. 253)
• A.2.1 Material equations(p. 254)
• A.2.2 Maxwell's equation in the dyadic scheme(p. 254)
• A.3 Wave equation(p. 255)
• A.3.1 There is no charges or currents ([characters not reproducible] = 0 and j = 0)(p. 255)
• A.3.2 The medium is homogeneous, ([mu] and [epsilon] space-independent)(p. 255)
• A.3.3 The medium is homogeneous and there is no charges or currents(p. 256)
• A.3.4 Case of harmonic fields(p. 256)
• A.4 Scalar and vector potentials(p. 256)
• A.5 Static regimes(p. 257)
• A.5.1 Poisson's and Laplace's equations(p. 257)
• A.5.2 Field generated by a single charge(p. 257)
• A.5.3 Flux of an electric field through a surface element(p. 258)
• A.5.4 Gauss' theorem(p. 258)
• A.6 Green's functions and Green's theorem(p. 260)
• A.6.1 Green's functions in classical potential theory(p. 260)
• A.6.2 Time dependent fields: the Helmholtz equation(p. 261)
• A.6.3 Green's theorem(p. 261)
• A.6.4 Green's dyadic(p. 262)
• A.7 Expansion of a field in term of a set of plane waves(p. 262)
• A.7.1 Basis(p. 263)
• A.7.2 Angular spectrum expansion (A.S.E.)(p. 263)
• A.8 Propagation of light using A.S.E.(p. 265)
• A.9 Analysis of the results(p. 266)
• Nomenclature(p. 269)
• List of Acronyms(p. 271)
• Glossary(p. 275)
• Index(p. 279)
• Author Index(p. 289)
• Bibliography(p. 297)