An introduction to surface analysis by electron spectroscopy John F. Watts.
Series Microscopy handbooks ; 22Detalles de publicación: Oxford [England] New York Oxford University Press Oxford [England] Royal Microscopical Society 1990.Descripción: x, 85 p. illISBN:- 0198564252
- 620/.44 20
- TP156.S95 W37 1990
| Imagen de cubierta | Tipo de ítem | Biblioteca actual | Biblioteca de origen | Colección | Ubicación en estantería | Signatura topográfica | Materiales especificados | Info Vol | URL | Copia número | Estado | Notas | Fecha de vencimiento | Código de barras | Reserva de ítems | Prioridad de la cola de reserva de ejemplar | Reservas para cursos | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Libro | Biblioteca Encarnación Valdés Colección General bev | 620.44 W351i (Navegar estantería(Abre debajo)) | Disponible | 80000000452634 |
Descripciones mejoradas de Syndetics:
Surface analysis--the examination of the outer few nanometers of a material--is a routine undertaking in laboratories throughout the world, and is of great importance in such areas as corrosion, adhesion, polymer surface treatment, and microelectronics fabrication. This handbook provides an introduction to the two most popular surface analysis techniques: X-ray photoelectron spectroscopy and Auger electron spectroscopy. It explains the underlying physical principles, discusses instrumentation, and looks at the interpretation of resulting spectra. Applications of the two techniques are considered, and a critical comparison with other available methods is also included. This fully illustrated guide will be a valuable introduction for students and researchers in physics, engineering, and materials science.
920806
Includes bibliographical references (p. [77]-81) and index.
Tabla de contenidos provista por Syndetics
- 1 Electron Spectroscopy: Some Basic Concepts
- 2 Electron Spectrometer Design
- 3 The Electron Spectrum: Qualitative and Quantitative Interpretation
- 4 Compositional Depth Profiling
- 5 Applications of Electron Spectroscopy in Materials Science
- 6 Comparison of XPS and AES with Other Analytical Techniques